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Thin film materials: stress, defect formation and surface evolution
L. B. Freund, S. SureshHow much do you like this book?
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This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films.
Categories:
Year:
2003
Edition:
1
Publisher:
Cambridge University Press
Language:
english
Pages:
820
ISBN 10:
0521822815
ISBN 13:
9780521822817
Series:
Cambridge Pocket Clinicians
File:
PDF, 12.40 MB
Your tags:
IPFS:
CID , CID Blake2b
english, 2003
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